HOLON, Israel & SAN JOSE, Calif.--(BUSINESS WIRE)--Today at the International Test Conference (ITC), Optimal+, the leader in big data analytics for semiconductor and electronics manufacturing operations, today announced the results of its first worldwide analysis of customer yield improvements and cost savings based on the company’s semiconductor solutions. From October 2015 through October 2016, Optimal+ analyzed customer data from over 50 billion devices to determine total customer cost savings enabled by the company’s products through improved yield, efficiency and quality. Optimal+ customers collectively saved in excess of US$250 million during the 12-month period.
The internal Optimal+ analysis conclusively revealed the advantages of using big data to enable better enterprise-wide decision making through increased global supply chain visibility.
Specifically, Optimal+ semiconductor customers realized the following benefits:
- More than $15 million was saved through advanced test time reduction as Optimal+ product analytics software reduced the need for many redundant and unnecessary tests.
- Up to a 60 percent reduction in test costs through advanced test methodologies including: Burn-In reduction, adaptive SLT and data-feed-forward for smart testing.
- The detection of hundreds of product drifts that would have negatively affected DPPM rates through the automated, real-time monitoring of every parametric test and the associated test processes used in manufacturing operations.
- Significant productivity increases due to the creation and adoption of hundreds of automated rules that optimized manufacturing throughput and streamlined supply chain inefficiencies.
- Substantial improvement in the overall visibility and management of each company’s respective supply chain, enabling tighter integration and faster decision making for dozens of OSATs and foundries that support the global semiconductor supply chain.
“Semiconductor companies are constantly searching for opportunities to improve yield and quality,” said Jessy Cavazos, Industry Director, Test & Measurement at Frost & Sullivan. “Optimal+ big data product analytics solutions enable semiconductor companies to track chips throughout the supply chain and recover chips that may have been binned incorrectly to increase overall yield.”
“The semiconductor industry continues to operate with lean margins, and every increase in yield recovery, every reduction in RMAs and every improvement in manufacturing efficiency translates into millions in savings for our customers,” said Dan Glotter, founder and CEO of Optimal+. “We are very honored by the trust our customers have placed in Optimal+ to collect, analyze and act on the billions of devices they manufacture every year across their global supply chains, and we look forward to continuing to deliver unmatched ROI in yield recovery, quality and productivity.
See More:
• Twitter: https://twitter.com/OptimalPlus
• Blog: http://optimalplus.com/blog
• LinkedIn: http://www.linkedin.com/company/optimalplus
To learn more on how Optimal+ is saving customers money and about the company’s innovative product suite, visit them at ITC, Booth #208.
About Optimal+
Optimal+ is the only big data analytics
software company providing an end-to-end solution that measurably
improves quality, yield, and productivity for semiconductor and
electronics manufacturing. From chip to board to system, our
enterprise-grade solutions ensure that all of your global manufacturing
data is collected, cleaned and analyzed in real time, enabling decisive
actions that enhance, certify and monitor the quality of semiconductor
and electronic products over their entire lifetime. With over 50 billion
devices processed annually, Optimal + provides Manufacturing
Intelligence™ solutions that enhance yield and productivity, reduce RMAs
and usher in an age of robust, long-term quality products. For more
information, visit www.optimalplus.com
and follow us on Twitter: https://twitter.com/OptimalPlus.
