BILLERICA, Mass.--(BUSINESS WIRE)--Bruker Corporation today announced the signing of an agreement to acquire the shares of Jordan Valley Semiconductors Ltd. The acquisition uniquely positions Bruker to offer unmatched solutions for advanced problems in nanotechnology research and semiconductor metrology. With trends toward increased connectivity and access to even larger amounts of data, new nanometrology needs are driving growth opportunities at advanced semiconductor nodes with even smaller features and three dimensional structures.
Jordan Valley’s innovative in-line X-ray metrology products complement Bruker’s leading position in analytical X-ray technologies. The combination and synergy between the X-ray metrology solutions of Jordan Valley and Bruker’s advanced X-ray technologies and automated Atomic Force Microscopy (AFM) systems is expected to position Bruker’s Semiconductor Division to be a leading-edge metrology system provider for semiconductor applications at advanced nodes.
Jordan Valley Semiconductors, located in Migdal Ha`Emek, Israel, has been at the forefront of X-ray metrology and defect-detection technology for the semiconductor industry for 30 years. Seventy-five percent of the world’s top 25 semiconductor manufacturers rely on Jordan Valley metrology tools for front-end and back-end applications, including the development of next-generation thin films. Jordan Valley's tools are fully automated, non-contact and non-destructive tools designed for production control on patterned or blanket wafers.
“The rapid growth of mobile technology, cloud computing and big data processing generates new requirements and opportunities for faster and more precise metrology of smaller feature sizes and 3D structures at advanced semiconductor nodes,” said Mark R. Munch, Ph.D., President of the NANO Group, which includes Bruker’s Semiconductor Division. “Jordan Valley has been a true pioneer in offering advanced and unique X-ray metrology solutions as feature sizes continue to shrink. The combination of Jordan Valley’s core metrology strengths with Bruker’s complementary X-ray technologies will enable us to stay ahead of this rapid development and continue to support the semiconductor industry with unmatched next-generation X-ray solutions.”
“For the past several decades, Jordan Valley has been committed to providing the best non-destructive X-ray metrology products, with the most responsive service and support to semiconductor manufacturers,” added Isaac Mazor, Founder and CEO of Jordan Valley Semiconductors. “We are extremely pleased to join Bruker and look forward to the enhanced product innovation and global market reach that we will enjoy within the Bruker Semiconductor Division.”
Financial details of the transaction were not disclosed. The transaction is expected to close in the fourth quarter of 2015, and the acquired business is expected to add approximately $25-$30 million to Bruker’s 2016 revenue, and approximately one to two cents to Bruker’s 2016 EPS.
Forward-Looking Statements
This press release includes forward-looking statements within the meaning of the Private Securities Litigation Reform Act of 1995. Forward-looking statements may be identified by the use of words such as “anticipate,” “believe,” “expect,” “will,” “may,” “estimate,” “plan,” “outlook,” and “project” and other similar expressions that predict or indicate future events or trends or that are not statements of historical matters. Such forward-looking statements reflect the views of management at the time such statements are made and are subject to a number of risks, uncertainties, estimates, and assumptions that may cause actual results to differ materially from current expectations. Although we believe the assumptions upon which these forward-looking statements are based are reasonable, any of these assumptions could prove to be inaccurate and the forward-looking statements based on these assumptions could be incorrect. Our actual future performance may differ materially from such expectations as a result of important risk factors, which include, in addition to those identified in the our Annual Report on Form 10-K for the year ended December 31, 2014 and our other subsequent filings with the Securities and Exchange Commission, risks and uncertainties associated with our ability to finalize and close, and then manage and integrate the acquisition of Jordan Valley Semiconductors. These risks and uncertainties could cause actual results to differ materially from those stated or implied in these forward-looking statements. We expressly disclaim any obligation to update or revise these forward-looking statements, except as required by law or regulation.
About Jordan Valley Semiconductors Ltd
Jordan Valley Semiconductors (JVS) offers the semiconductor industry a comprehensive portfolio of advanced metrology and defect inspection tools, based on X-ray technologies, such as XRR (X-ray reflectometry), XRF (X-ray fluorescence), XRD (X-ray diffraction), and others. Jordan Valley's investors include Clal Industries and Investments Ltd. (TASE:CII), Intel Capital (INTC) and Elron Electronics Industries Ltd. (ELRN.TA). With headquarters in Migdal Ha`Emek, Israel, the company has subsidiaries in Durham, UK; Austin, TX (USA); Hsin-Chu, Taiwan; Suwon, Korea; and other offices and sales representatives worldwide. For more information about JVS, please visit www.jvsemi.com.
About Bruker Corporation (NASDAQ: BRKR)
For more than 50 years, Bruker has enabled scientists to make breakthrough discoveries and develop new applications that improve the quality of human life. Bruker’s high-performance scientific research instruments and high-value analytical solutions enable scientists to explore life and materials at molecular, cellular and microscopic levels.
In close cooperation with our customers, Bruker is enabling innovation, productivity and customer success in life science molecular research, in applied and pharma applications, in microscopy, nano-analysis and industrial applications, as well as in cell biology, preclinical imaging, clinical research, microbiology and molecular diagnostics. For more information, please visit www.bruker.com.