Dublin - Research and Markets (http://www.researchandmarkets.com/research/0a238daa/scanning_probe_mic) has announced the addition of John Wiley and Sons Ltd's new book "Scanning Probe Microscopy of Soft Matter: Fundamentals and Practices" to their offering.
Well-structured and adopting a pedagogical approach, this self-contained monograph covers the fundamentals of scanning probe microscopy, showing how to use the techniques for investigating physical and chemical properties on the nanoscale and how they can be used for a wide range of soft materials. It concludes with a section on the latest techniques in nanomanipulation and patterning.
This first book to focus on the applications is a must-have for both newcomers and established researchers using scanning probe microscopy in soft matter research.
From the contents:
- Atomic Force Microscopy and Other Advanced Imaging Modes
- Probing of Mechanical, Thermal Chemical and Electrical Properties
- Amorphous, Poorly Ordered and Organized Polymeric Materials
- Langmuir-Blodgett and Layer-by-Layer Structures
- Multi-Component Polymer Systems and Fibers
- Colloids and Microcapsules
- Biomaterials and Biological Structures
- Nanolithography with Intrusive AFM Tipand Dip-Pen Nanolithography
- Microcantilever-Based Sensors
Key Topics Covered:
Preface
Part One Microscopy Fundamentals
1 Introduction
2 Scanning Probe Microscopy Basics
3 Basics of Atomic Force Microscopy Studies of Soft Matter
4 Advanced Imaging Modes
Part Two Probing Nanoscale Physical and Chemical Properties
5 Mechanical Properties of Polymers and Macromolecules
6 Probing of Microthermal Properties
7 Chemical and Electrical Properties
8 Scanning Probe Optical Techniques
Part Three Scanning Probe Techniques for Various Soft Materials
9 Amorphous and Poorly Ordered Polymers
11 Highly Branched Macromolecules
12 Multicomponent Polymer Systems and Fibers
13 Engineered Surface and Interfacial Materials
14 Langmuir-Blodgett and Layer-by-Layer Structures
15 Colloids and Microcapsules
16 Biomaterials and Biological Structures
Part Four Nanomanipulation, Patterning, and Sensing
17 Scanning Probe Microscopy on Practical Devices
18 Nanolithography with Intrusive AFM Tip
19 Dip-Pen Nanolithography
20 Microcantilever-Based Sensors
Author
Vladimir V. Tsukruk received his MS degree in physics from the National University of Ukraine, and his PhD and DSc in chemistry from the National Academy of Sciences of Ukraine. He carried out his post-doc at the universities of Marburg, Germany, and Akron, USA, and is currently a professor at the School of Materials Science and Engineering, Georgia Institute of Technology. He was elected an APS Fellow in 2010 and an MRS Fellow in 2011. He serves on the editorial advisory boards of five professional journals and has co-authored around 300 refereed articles in archival journals, as well as five books.
Currently an assistant professor in the Department of Mechanical Engineering and Materials Science at Washington University in St. Louis, Srikanth Singamaneni received his MS degree in electrical engineering from Western Michigan University and his PhD in polymer materials science and engineering from Georgia Institute of Technology. A recipient of the Materials Research Society Graduate Student Gold Award, he has co-authored over 60 refereed articles in archival journals as well as five book chapters.
For more information visit http://www.researchandmarkets.com/research/0a238daa/scanning_probe_mic
Source: John Wiley and Sons Ltd